Covalent Metrology Advances (Scanning) Transmission Electron Microscopy Analytical Services

Covalent Metrology has completed installation of a new Thermo Scientific Talos F200X G2 S/TEM at its Sunnyvale, CA headquarters. This system, available now, generates clearer images with greater and improved elemental and structural information compared to earlier generation S/TEMs. The Talos S/TEM will round out a complete suite of in-house instrumentation for electron microscopy analysis, enabling Covalent to deliver industry leading S/TEM analysis with rapid turnaround times and no expedite fees.

Covalent Metrology is now positioned to help scientists and engineers tap into S/TEM characterization solutions by providing affordable atomic-level resolution images, diffraction patterns for crystallography, and elemental composition through energy dispersive x-ray spectroscopy (EDS). Previously, accessing these types of high-quality S/TEM measurements could often be expensive, unpredictable, and challenging for many companies and researchers without robust internal S/TEM resources. At the same time, results of S/TEM analysis can prove crucial for R&D work spanning a vast array of industries: from microelectronics and semiconductors to nanomaterials, thin films, molecular biology, and more.

The Talos F200X G2 S/TEM includes a Gatan OneView CCD camera, conferring 16x greater resolution and pixel density over past generations of camera systems for maximized information capture in every frame. Additionally, its quad-EDS detectors allow for rapid, high-sensitivity elemental analysis with reduced risk of sample damage. These upgrades, along with in-house sample preparation using Covalent’s two high-precision dual-beam FIB-SEM systems, make exceptional S/TEM data accessible to clients easily and efficiently.

To head Covalent’s new S/TEM service branch, the company has appointed two leading S/TEM experts: Jason Donald, as Director, S/TEM and Lamella Prep, and Roozbeh Nikkhah Moshaie, PhD, as Senior Member of Technical Staff for S/TEM characterization. Jason brings over 24 years of operational experience with FEI / Thermo Fisher electron microscopes, and Dr. Nikkhah Moshaie is a materials engineer with over 10 years of experience in TEM characterization of metallurgical and nanomaterial samples.

“We are ecstatic to utilize the Talos and our new, recently-announced, in-house Helios 5 and Scios focused ion beam scanning electron microscopes (FIB-SEMs) to deliver world-class S/TEM characterization!” stated Jeff Sullivan, VP, Metrology Partners. “These systems generate exceptional images in addition to analytical results relevant to addressing customers’ specific needs. With our burgeoning S/TEM team and the Talos, Covalent will broaden and deepen our support of client innovations in advanced materials.”