OEwaves Introduces Excess Laser RIN Measurement Feature
Company’s Microwave Photonic Test and Measurement Division announces Excess Laser Relative Intensity Noise (RIN) measurement option available for its HI-Q® RIN Analyzer product up to 40GHz.
Pasadena, CA (PRUnderground) June 23rd, 2022
OEwaves, Inc., a leader in innovative microwave photonic products and solutions, today launched a new optional Excess Laser Relative Intensity Noise (RIN) measurement feature for its acclaimed high frequency OE4001 RIN Analyzer system. The new Excess RIN measurement feature removes the inherent shot noise and thermal/system noise common in conventional laser RIN measurement method in the standard OE4001 RIN Analyzer. The new feature boasts Excess RIN floor extending down to -168 dB/Hz or better.
Total noise from a laser typically includes shot noise, thermal/system noise, and light power (total photon energy per second) fluctuation. RIN is defined to represent the total amount of photon noise within a given bandwidth. However, the term RIN and excess photon noise have often been used interchangeably and have been set equal for most applications. Nevertheless, it is critical to differentiate the excess photon noise from other sources of noise in applications such as coherent communication, optical sensors, clinical research, as well as other emerging fields where excess photon noise is limiting the performance.
OEwaves HI-Q® OE4001 RIN Analyzer is a high frequency ultra-low RIN measurement system developed to support a wide range of wavelengths covering spectral bands from visible to near-infrared wavelength. With the new optional Excess RIN feature the system provides a complete total and excess laser RIN measurement capability up to 40 GHz. OE4001 RIN Analyzer operates with ease, speed, and precision, via a simple graphic user interface on a notebook PC, without requiring any additional test equipment.
The OEwaves HI-Q® ultra-low noise measurement product family consists of our flagship OE4000 Laser Phase Noise/Linewidth Analyzer, OE4001 RIN Analyzer, and OE8000 Microwave Phase Noise Analyzer systems and are available in a variety of configurations and options, among other customizable configurations.
More information about OEwaves’ leading microwave photonic products is available at www.oewaves.com
About OEwaves Inc.
OEwaves, Inc., headquartered in Pasadena, California, is a leader in innovative microwave-photonic products and solutions. OEwaves develops state-of-the-art technologies and provides products in support of communication, sensor, RADAR/LIDAR, stable clocking, and test and measurement systems for commercial and military markets.
OEwaves was founded in 2000 and has maintained an Intellectual Property Portfolio of over 126 cases and has received numerous awards, including two prestigious SPIE Prism Awards, as well as the Patrick Soon-Shiong Innovation Award. The company has been ranked in the top 20 of the Institute of Electrical and Electronics Engineers (IEEE) Semiconductor Manufacturing Patent Power.